Rob Johnston, Director Metrology Systems, CAD MicroSolutions Inc, brings more than twenty-five years of senior level Metrology Solutions advise to the Manufacturing/Fabricating/CAD and Quality Control markets. He has extensive experience in Co-Ordinate Metrology, GD&T, Reverse Engineering, Assembly Stack-ups and Simulation, Statistical Process Control and Point Cloud Metrology from some of the leading Metrology System providers, including Origin International, GOM Metrology, Zeiss IGS, NDI, Polyworks, GloveFit Systems and Z&F. Rob has worked on 1000’s of customer-based Metrology Solutions domestically and internationally in Europe, South America and Asia.  

Tech Talk

Title: Metrology's Role in Topology Optimization, Defect Detection and Assembly Stack-ups

Description:

Modern Metrology has evolved into using digital scan data for many applications in the last few years. This presentation will review and discuss scan data's role in Topology Optimization, Defect Detection and Assembly Stack-ups.

Methods: Using Metrology Grade Scan Data from Optical Scanning tools, the scan data can be used in Reverse Engineering/Topology Optimization using software tools like Design-X and Simulia. The same data can be used for cosmetic defect detection with GOM Inspect, or Digital Assembly in CheckMate for SolidWorks.

Results: While the methods above sprawl across many different applications, the root of the capabilities lie with the quality of the mesh data. When deployed properly, A) clients are modernizing their parts to save weight without compromising safety, B) Removing subjectivity behind visual inspection, and C) know if assemblies will fit together prior to the parts being in the same facility.

Conclusion: Using Metrology Grade scan data opens many new avenues for digital metrology analytics in new applications, saving engineering departments time, frustration, and money. Build better parts with more confidence.